Verification of Charge Transfer in Metal-Insulator-Oxide Semiconductor Diodes via Defect Engineering of Insulator

Electron-Transport Characteristics through Aluminum Oxide (100) and (012) in a Metal-Insulator-Metal Junction System: Density Functional Theory-Nonequilibrium Green Function Approach. - Abstract - Europe PMC

Verification of Charge Transfer in Metal-Insulator-Oxide Semiconductor Diodes via Defect Engineering of Insulator

Role of defects on the transparent conducting properties of binary metal oxide thin film electrodes - ScienceDirect

Nanoscale All-Oxide-Heterostructured Bio-inspired Optoresponsive Nociceptor

The electrical characteristics of the two oxide TFTs with different

Control over electrically bistable properties of layer-by-layer-assembled polymer/organometal multilayers

Defect engineering in ZnIn2X4 (X=S, Se, Te) semiconductors for improved photocatalysis - ScienceDirect

Verification of Charge Transfer in Metal-Insulator-Oxide Semiconductor Diodes via Defect Engineering of Insulator. - Abstract - Europe PMC

Verification of Charge Transfer in Metal-Insulator-Oxide Semiconductor Diodes via Defect Engineering of Insulator

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Schematic diagrams of the resistive switching mechanisms for TiON films

Contact properties of a low-resistance aluminum-based electrode with metal capping layers in vertical oxide thin-film transistors - Journal of Materials Chemistry C (RSC Publishing) DOI:10.1039/D3TC02880A

Proposed mechanisms for the different distributions of defects in the

Current transport characteristics and schematic diagram of MIOS diodes